The effect of pulse repetition rate on laser ablation of polyimide and polymethylmethacrylate-based polymers

FC Burns, SR Cain - Journal of Physics D: Applied Physics, 1996 - iopscience.iop.org
The effect of pulse repetition rate on polymer ablation was studied experimentally and
theoretically for polyimide and 8230 photoresist, a polymethylmethacrylate (PMMA)-based polymer…

On single‐photon ultraviolet ablation of polymeric materials

SR Cain, FC Burns, CE Otis - Journal of applied physics, 1992 - pubs.aip.org
The nature of uv ablation of organic polymers is discussed in terms of a pseudo‐zeroth‐order
rate law of the form dx/dt = k 0 e −(E act /kT) , where E act is assumed to be the strength of …

Photothermal description of polymer ablation: Absorption behavior and degradation time scales

SR Cain, FC Burns, CE Otis, B Braren - Journal of applied physics, 1992 - pubs.aip.org
A photothermal model of ablation is used to investigate the time scales for polymer degradation
by UV laser light. In the absence of a significant incubation effect, strong absorbers (eg, …

A photothermal model for polymer ablation: chemical modification

SR Cain - The Journal of Physical Chemistry, 1993 - ACS Publications
Ablation of strongly absorbing polymers, exemplified by polyimide, and weakly absorbing
polymers, exemplified by poly (methyl methacrylate), is discussed in terms of a photothermal …

The expermental and numerical study of electromigration in 2.5 D packaging

J Xu, Y Niu, SR Cain, S McCann… - 2018 IEEE 68th …, 2018 - ieeexplore.ieee.org
In this study, an electromigration (EM) experiment of a ball in a flip chip package with
eutectic SnPb solder has been performed. The test vehicles had two types of ball grid array (BGA) …

Distinguishing between lognormal and Weibull distributions [time-to-failure data]

SR Cain - IEEE Transactions on Reliability, 2002 - ieeexplore.ieee.org
A previous method for deciding if a set of time-to-fail data follows a lognormal distribution or
a Weibull distribution is expanded upon. Pearson's s-correlation coefficient is calculated for …

Time 0 void evolution and effect on electromigration

…, S McCann, H Wang, VL Pham, SR Cain… - 2019 IEEE 69th …, 2019 - ieeexplore.ieee.org
In this study, an Electromigration (EM) acceleration test was conducted at 150 oC ambient
temperature with 12A current. The solder joint was made of SAC305. Time 0 void evolution …

An assessment of electromigration in 2.5 D packaging

…, H Wang, J Wang, VL Pham, SR Cain… - 2019 IEEE 69th …, 2019 - ieeexplore.ieee.org
In this study, an accelerated Electromigration (EM) test was performed. The test vehicle has
four types of common interconnect structure. The first one is a classic Ball Grid Array (BGA), …

A reaction path for halogen elimination from CX2Y2, and its dynamical implications

SR Cain, R Hoffmann, ER Grant - The Journal of Physical …, 1981 - ACS Publications
A qualitative molecular orbital exploration of the reaction path for CX2Y2-*· CY2+ X2 is
presented. The least-motion departure is symmetry forbidden and a less symmetrical path is …

Experimental study of the kinetics of transient liquid phase solidification reaction in electroplated gold-tin layers on copper

R Venkatraman, JR Wilcox, SR Cain - Metallurgical and Materials …, 1997 - Springer
The kinetics of transient liquid phase (TLP) solidification in Au-Sn layers electroplated on
Cu foil was investigated using differential scanning calorimetry (DSC). The solidification …